Deep sub-micron ESD GGNMOS layout design and optimization

In the field of integrated circuits, ESD (Electro Static Discharge) has always been a rather serious problem of reliability. Enhanced ESD tolerance of IC chips became a focus of research on IC failure protection design. The thesis is better to solve the multi-fingered non-uniform conduction of ESD d...

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Bibliographic Details
Main Author: Jun Shi
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201819804009