Annealing-Driven Microstructural Evolution and Its Effects on the Surface and Nanomechanical Properties of Cu-Doped NiO Thin Films

The effects of annealing temperature on the structural, surface morphological and nanomechanical properties of Cu-doped (Cu-10 at %) NiO thin films grown on glass substrates by radio-frequency magnetron sputtering are investigated in this study. The X-ray diffraction (XRD) results indicated that the...

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Bibliographic Details
Main Authors: San-Ho Wang, Sheng-Rui Jian, Guo-Ju Chen, Huy-Zu Cheng, Jenh-Yih Juang
Format: Article
Language:English
Published: MDPI AG 2019-02-01
Series:Coatings
Subjects:
XRD
Online Access:https://www.mdpi.com/2079-6412/9/2/107