ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory
Advanced capacity and density of memory have resulted in an increase in the probability of memory faults. The in-memory Error Correction Code (ECC), which solves this problem, is a widely used technology to improve the yield of highly integrated memory. However, the use of in-memory ECC causes probl...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9548033/ |