A Collective Study on Modeling and Simulation of Resistive Random Access Memory

Abstract In this work, we provide a comprehensive discussion on the various models proposed for the design and description of resistive random access memory (RRAM), being a nascent technology is heavily reliant on accurate models to develop efficient working designs and standardize its implementatio...

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Bibliographic Details
Main Authors: Debashis Panda, Paritosh Piyush Sahu, Tseung Yuen Tseng
Format: Article
Language:English
Published: SpringerOpen 2018-01-01
Series:Nanoscale Research Letters
Online Access:http://link.springer.com/article/10.1186/s11671-017-2419-8