Further characterization of the surface properties of the SiC particles through complementarity of XPS and IGC-ID techniques
In this work we demonstrated the necessity to complement the techniques XPS and IGC-ID to evaluate the surface properties of the SiC materials. We have studied four SiC materials with different particles sizes being 3 of them of a Si/C ratio close to the stoichiometry whereas for the fourth one, thi...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2018-11-01
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| Series: | Boletín de la Sociedad Española de Cerámica y Vidrio |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S036631751830030X |