HIGH SPEED ONLINE FAULT DETECTION OF 64-BIT RIPPLE CARRY ADDER USING MODIFIED MODULAR REDUNDANCY
Developments in VLSI technology has increased density of chips so that, processing elements are capable of doing complex computations. The increase in complexity and density of the VLSI chip has made electronic systems more susceptible to defects. Therefore, testing and fault tolerance technique...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
ICT Academy of Tamil Nadu
2015-10-01
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| Series: | ICTACT Journal on Microelectronics |
| Subjects: | |
| Online Access: | http://ictactjournals.in/paper/IJME_paper_4_115_119.pdf |