Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index

Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index

Both increased harvest index (HI) and increased dry matter (DM) are beneficial to yield; however, little is known about the priority of each under different yield levels. This paper aims to determine whether HI or DM is more important and identify the physiological attributes that act as indicators...

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Bibliographic Details
Main Authors: Jianzhao Duan, Yapeng Wu, Yi Zhou, Xingxu Ren, Yunhui Shao, Wei Feng, Yunji Zhu, Li He, Tiancai Guo
Format: Article
Language:English
Published: Frontiers Media S.A. 2018-10-01
Series:Frontiers in Plant Science
Subjects:
winter wheat
increased yield
harvest index
dry matter
leaf area index
radiation interception
Online Access:https://www.frontiersin.org/article/10.3389/fpls.2018.01457/full

Internet

https://www.frontiersin.org/article/10.3389/fpls.2018.01457/full

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