Nanoscale X-Ray Diffraction of Silk Fibers

This report focuses on current possibilities and perspectives of scanning X-ray nanodiffraction for probing nanoscale heterogeneities in silk fibers such as nanofibrils, skin-core morphologies, nanocrystalline inclusions and fine fibers down to submicron diameters.

Bibliographic Details
Main Authors: Christian Riekel, Manfred Burghammer, Martin Rosenthal
Format: Article
Language:English
Published: Frontiers Media S.A. 2019-12-01
Series:Frontiers in Materials
Subjects:
Online Access:https://www.frontiersin.org/article/10.3389/fmats.2019.00315/full