Postprocessing Algorithm for Driving Conventional Scanning Tunneling Microscope at Fast Scan Rates

We present an image postprocessing framework for Scanning Tunneling Microscope (STM) to reduce the strong spurious oscillations and scan line noise at fast scan rates and preserve the features, allowing an order of magnitude increase in the scan rate without upgrading the hardware. The proposed meth...

Full description

Bibliographic Details
Main Authors: Hao Zhang, Xianqi Li, Yunmei Chen, Jewook Park, An-Ping Li, X.-G. Zhang
Format: Article
Language:English
Published: Hindawi-Wiley 2017-01-01
Series:Scanning
Online Access:http://dx.doi.org/10.1155/2017/1097142