Automated visual fault inspection of optical elements using machine vision technologies
Light-emitting diode (LED) lenses are one kind of common optical elements applied in many modern electronic devices. The LED lens with textured and uneven surface is hard to inspect appearance faults. This research suggests a wavelet packet transform-based partial least squares method to inspect vis...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Institut za istrazivanja i projektovanja u privredi
2018-01-01
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| Series: | Istrazivanja i projektovanja za privredu |
| Subjects: | |
| Online Access: | https://scindeks-clanci.ceon.rs/data/pdf/1451-4117/2018/1451-41171804447L.pdf |