Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging

Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging

Abstract Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies. This technique is based on high spatial resolution (50–100 nm), high surface sensitivity (1–2 nm top-layer), and statistical analytic power. In mass s...

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Bibliographic Details
Main Authors: Sohee Yoon, Tae Geol Lee
Format: Article
Language:English
Published: SpringerOpen 2018-09-01
Series:Nano Convergence
Subjects:
Sample preparation
ToF–SIMS imaging
Frozen hydrate analysis
Freeze drying
Adhesive tape mounting
Thaw mounting
Online Access:http://link.springer.com/article/10.1186/s40580-018-0157-y

Internet

http://link.springer.com/article/10.1186/s40580-018-0157-y

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