A Surface Photovoltage Study of Surface Defects on Co-Doped TiO2 Thin Films Deposited by Spray Pyrolysis
Surface photovoltage (SPV) spectroscopy is a powerful tool for studying electronic defects on semiconductor surfaces, at interfaces, and in bulk for a wide range of materials. Undoped and Cobalt-doped TiO2 (CTO) thin films were deposited on Crystalline Silicon (c-Si) and Flourine doped Tin oxide (Sn...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2016-07-01
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| Series: | Coatings |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-6412/6/3/30 |