Near-field transmission matrix microscopy for mapping high-order eigenmodes of subwavelength nanostructures

Nanoscale integrated photonic devices have complicated combinations of optical eigenmodes. Here, the authors develop a far- to near-field transmission matrix microscopy that enables measuring higher-order modes of nanostructures beyond the capabilities of conventional near-field microscopy.

Bibliographic Details
Main Authors: Eunsung Seo, Young-Ho Jin, Wonjun Choi, Yonghyeon Jo, Suyeon Lee, Kyung-Deok Song, Joonmo Ahn, Q.-Han Park, Myung-Ki Kim, Wonshik Choi
Format: Article
Language:English
Published: Nature Publishing Group 2020-05-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-020-16263-z