Near-field transmission matrix microscopy for mapping high-order eigenmodes of subwavelength nanostructures
Nanoscale integrated photonic devices have complicated combinations of optical eigenmodes. Here, the authors develop a far- to near-field transmission matrix microscopy that enables measuring higher-order modes of nanostructures beyond the capabilities of conventional near-field microscopy.
Main Authors: | Eunsung Seo, Young-Ho Jin, Wonjun Choi, Yonghyeon Jo, Suyeon Lee, Kyung-Deok Song, Joonmo Ahn, Q.-Han Park, Myung-Ki Kim, Wonshik Choi |
---|---|
Format: | Article |
Language: | English |
Published: |
Nature Publishing Group
2020-05-01
|
Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-020-16263-z |
Similar Items
-
Control of randomly scattered surface plasmon polaritons for multiple-input and multiple-output plasmonic switching devices
by: Wonjun Choi, et al.
Published: (2017-03-01) -
k-space imaging of the eigenmodes of sharp gold tapers for scanning near-field optical microscopy
by: Martin Esmann, et al.
Published: (2013-10-01) -
Imaging of viscoelastic soft matter with small indentation using higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy
by: Miead Nikfarjam, et al.
Published: (2018-04-01) -
Fabrication of subwavelength scale optical nanostructures
by: Haq, Mohammad Tahdiul
Published: (2011) -
Effect of Eigenmode Frequency on Loss Tangent Atomic Force Microscopy Measurements
by: Babak Eslami, et al.
Published: (2021-07-01)