Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography.

Focused-ion beam lift-out and annular milling is the most common method used for obtaining site specific specimens for atom probe tomography (APT) experiments and transmission electron microscopy. However, one of the main limitations of this technique comes from the structural damage as well as chem...

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Bibliographic Details
Main Authors: Nicolás Alfonso Rivas, Aslihan Babayigit, Bert Conings, Torsten Schwarz, Andreas Sturm, Alba Garzón Manjón, Oana Cojocaru-Mirédin, Baptiste Gault, Frank Uwe Renner
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2020-01-01
Series:PLoS ONE
Online Access:https://doi.org/10.1371/journal.pone.0227920