Critical thickness for the formation of misfit dislocations originating from prismatic slip in semipolar and nonpolar III-nitride heterostructures

We calculate the critical thickness for misfit dislocation (MD) formation in lattice mismatched semipolar and nonpolar III-nitride wurtzite semiconductor layers for the case of MDs originated from prismatic slip (PSMDs). It has been shown that there is a switch of stress relaxation modes from genera...

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Bibliographic Details
Main Authors: A. M. Smirnov, E. C. Young, V. E. Bougrov, J. S. Speck, A. E. Romanov
Format: Article
Language:English
Published: AIP Publishing LLC 2016-01-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.4939907