Multiview Transfer Learning for Software Defect Prediction

Multiview Transfer Learning for Software Defect Prediction

Most software defect prediction models usually assume that enough historical training instances with labels are available. Additionally, the training data and the predicted instances should share the same features to ensure the prediction accuracy. However, in practice, there are many datasets with...

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Bibliographic Details
Main Authors: Jinyin Chen, Yitao Yang, Keke Hu, Qi Xuan, Yi Liu, Chao Yang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Multiview transfer learning
software defect prediction
active learning
neural network
Online Access:https://ieeexplore.ieee.org/document/8600320/

Internet

https://ieeexplore.ieee.org/document/8600320/

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