Multiview Transfer Learning for Software Defect Prediction
Most software defect prediction models usually assume that enough historical training instances with labels are available. Additionally, the training data and the predicted instances should share the same features to ensure the prediction accuracy. However, in practice, there are many datasets with...
Main Authors: | Jinyin Chen, Yitao Yang, Keke Hu, Qi Xuan, Yi Liu, Chao Yang |
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Format: | Article |
Language: | English |
Published: |
IEEE
2019-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8600320/ |
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