A Systematic Study of Compositionally Dependent Dielectric Tensors of SnS<i><sub>x</sub></i>Se<sub>1-<i>x</i></sub> Alloys by Spectroscopic Ellipsometry

A Systematic Study of Compositionally Dependent Dielectric Tensors of SnS<i><sub>x</sub></i>Se<sub>1-<i>x</i></sub> Alloys by Spectroscopic Ellipsometry

We report the dielectric tensors on the cleavage plane of biaxial SnS<i><sub>x</sub></i>Se<sub>1-<i>x</i></sub> alloys in the spectral energy region from 0.74 to 6.42 eV obtained by spectroscopic ellipsometry. Single-crystal SnS<i><sub>x<...

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Bibliographic Details
Main Authors: Xuan Au Nguyen, Thi Minh Hai Nguyen, Tae Jung Kim, Long Van Le, Tung Hoang Nguyen, Bogyu Kim, Kyujin Kim, Wonjun Lee, Sunglae Cho, Young Dong Kim
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Crystals
Subjects:
SnSSe alloy
anisotropic dielectric tensor
ellipsometry
Online Access:https://www.mdpi.com/2073-4352/11/5/548

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https://www.mdpi.com/2073-4352/11/5/548

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