The yield estimation of semiconductor products based on truncated samples
Product yield reflects the potential product quality and reliability, which means that high yield corresponds to good quality and high reliability. Yet consumers usually couldn’t know the actual yield of the products they purchase. Generally, the products that consumers...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2013-01-01
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| Series: | International Journal of Metrology and Quality Engineering |
| Subjects: | |
| Online Access: | https://doi.org/10.1051/ijmqe/2013050 |