Probing the edge-related properties of atomically thin MoS2 at nanoscale
Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as...
| Main Authors: | , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2019-12-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-019-13486-7 |