Mechanical characterization of carbon nanomembranes from self-assembled monolayers

This paper reports on the mechanical characterization of carbon nanomembranes (CNMs) with a thickness of 1 nm that are fabricated by electron-induced crosslinking of aromatic self-assembled monolayers (SAMs). A novel type of in situ bulge test employing an atomic force microscope (AFM) is utilized t...

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Bibliographic Details
Main Authors: Xianghui Zhang, André Beyer, Armin Gölzhäuser
Format: Article
Language:English
Published: Beilstein-Institut 2011-12-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.2.92