Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations
The goal in this paper is to show how many high-frequency electromagnetic metrology areas can be understood and formulated in terms of entropy evolution, production, and fluctuations. This may be important in nanotechnology where an understanding of fluctuations of thermal and electromagnetic energy...
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| Format: | Article |
| Language: | English |
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MDPI AG
2008-10-01
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| Series: | Entropy |
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| Online Access: | http://www.mdpi.com/1099-4300/10/4/411/ |