Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films
A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni50Mn32Sn18 thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our resu...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2013-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4849795 |