Histomorphometric Analysis of Osseointegrated Grade V Titanium Mini Transitional Implants in Edentulous Mandible by Backscattered Scanning Electron Microscopy (BS-SEM)

Histomorphometric Analysis of Osseointegrated Grade V Titanium Mini Transitional Implants in Edentulous Mandible by Backscattered Scanning Electron Microscopy (BS-SEM)

The purpose of this study is to assess the use of grade V titanium mini transitional implants (MTIs) immediately loaded by a temporary overdenture. For this, a histomorphometric analysis of the bone area fraction occupancy (BAFO) was performed by backscattered scanning electron microscopy (BS-SEM)....

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Bibliographic Details
Main Authors: Víctor Beltrán, Benjamín Weber, Ricardo Lillo, María-Cristina Manzanares, Cristina Sanzana, Nicolás Fuentes, Pablo Acuña-Mardones, Ivan Valdivia-Gandur
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Metals
Subjects:
grade V titanium
mini transitional implants
narrow diameter implant
backscattered electrons
Online Access:https://www.mdpi.com/2075-4701/11/1/2

Internet

https://www.mdpi.com/2075-4701/11/1/2

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