Evaluation of the performance of classification algorithms for XFEL single-particle imaging data

Evaluation of the performance of classification algorithms for XFEL single-particle imaging data

Using X-ray free-electron lasers (XFELs), it is possible to determine three-dimensional structures of nanoscale particles using single-particle imaging methods. Classification algorithms are needed to sort out the single-particle diffraction patterns from the large amount of XFEL experimental data....

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Bibliographic Details
Main Authors: Yingchen Shi, Ke Yin, Xuecheng Tai, Hasan DeMirci, Ahmad Hosseinizadeh, Brenda G. Hogue, Haoyuan Li, Abbas Ourmazd, Peter Schwander, Ivan A. Vartanyants, Chun Hong Yoon, Andrew Aquila, Haiguang Liu
Format: Article
Language:English
Published: International Union of Crystallography 2019-03-01
Series:IUCrJ
Subjects:
X-ray free-electron lasers (XFELs)
single-particle imaging
classification algorithms
electron-density map reconstruction
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252519001854

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http://scripts.iucr.org/cgi-bin/paper?S2052252519001854

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