Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

Abstract Spatially encoded measurements of transient optical transmissivity became a standard tool for temporal diagnostics of free-electron-laser (FEL) pulses, as well as for the arrival time measurements in X-ray pump and optical probe experiments. The modern experimental techniques can measure ch...

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Bibliographic Details
Main Authors: Victor Tkachenko, Vladimir Lipp, Martin Büscher, Flavio Capotondi, Hauke Höppner, Nikita Medvedev, Emanuele Pedersoli, Mark J. Prandolini, Giulio M. Rossi, Franz Tavella, Sven Toleikis, Matthew Windeler, Beata Ziaja, Ulrich Teubner
Format: Article
Language:English
Published: Nature Publishing Group 2021-03-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-84677-w

Internet

https://doi.org/10.1038/s41598-021-84677-w

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