Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics
This study presents a near-field immunity test (NFIT) method for the fast debugging of radiated susceptibility of industrial devices. The proposed approach is based on the development of an NFIT setup which comprises of developed near-field electric and magnetic field probes and device under test (D...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-07-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/8/7/797 |