Rapid Recognition of Field-Grown Wheat Spikes Based on a Superpixel Segmentation Algorithm Using Digital Images

Rapid Recognition of Field-Grown Wheat Spikes Based on a Superpixel Segmentation Algorithm Using Digital Images

Wheat spike number, which could be rapidly and accurately estimated by the image processing technology, serves as the basis for crop growth monitoring and yield prediction. In this research, simple linear iterative clustering (SLIC) was performed for superpixel segmentation of the digital images of...

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Bibliographic Details
Main Authors: Changwei Tan, Pengpeng Zhang, Yongjiang Zhang, Xinxing Zhou, Zhixiang Wang, Ying Du, Wei Mao, Wenxi Li, Dunliang Wang, Wenshan Guo
Format: Article
Language:English
Published: Frontiers Media S.A. 2020-03-01
Series:Frontiers in Plant Science
Subjects:
wheat spike
recognition
superpixel segmentation
digital images
estimation
Online Access:https://www.frontiersin.org/article/10.3389/fpls.2020.00259/full

Internet

https://www.frontiersin.org/article/10.3389/fpls.2020.00259/full

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