Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems. The high logic density and advancements in architectural features make static random access memory (SRAM)-based...

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Bibliographic Details
Main Authors: T.S. Nidhin, Anindya Bhattacharyya, R.P. Behera, T. Jayanthi, K. Velusamy
Format: Article
Language:English
Published: Elsevier 2017-12-01
Series:Nuclear Engineering and Technology
Subjects:
Configuration Memory
Fault Tolerance
FPGAs
Nuclear Power Plant I&C Systems
Radiation Effects
Single Event Effects
Single Event Upset
SEU Mitigation
Soft Errors
TID Effects
Online Access:http://www.sciencedirect.com/science/article/pii/S1738573317302723

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http://www.sciencedirect.com/science/article/pii/S1738573317302723

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