Optical Beam Deflection Based AFM with Integrated Hardware and Software Platform for an Undergraduate Engineering Laboratory
Atomic force microscopy (AFM) has been used extensively in nanoscience research since its invention. Recently, many teaching laboratories in colleges, undergraduate institutions, and even high schools incorporate AFM as an effective teaching tool for nanoscience education. This paper presents an opt...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2017-02-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2076-3417/7/3/226 |