A Hybrid Crack Detection Approach for Scanning Electron Microscope Image Using Deep Learning Method
The scanning electron microscope (SEM) is widely used in the analysis and research of materials, including fracture analysis, microstructure morphology, and nanomaterial analysis. With the rapid development of materials science and computer vision technology, the level of detection technology is con...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi-Wiley
2021-01-01
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| Series: | Scanning |
| Online Access: | http://dx.doi.org/10.1155/2021/5558668 |