Majority and Minority Voted Redundancy Scheme for Safety-Critical Applications with Error/No-Error Signaling Logic

Majority and Minority Voted Redundancy Scheme for Safety-Critical Applications with Error/No-Error Signaling Logic

In the era of nanoelectronics, multiple faults or failures of function blocks are likely to occur. To withstand these, higher levels of redundancy are suggested to be employed in at least the sensitive portions of a circuit or system. In this context, the N-modular redundancy (NMR) scheme may be use...

Full description

Bibliographic Details
Main Authors: Padmanabhan Balasubramanian, Douglas Maskell, Nikos Mastorakis
Format: Article
Language:English
Published: MDPI AG 2018-10-01
Series:Electronics
Subjects:
redundancy
fault tolerance
low power
ASIC
digital circuits
standard cells
CMOS
Online Access:https://www.mdpi.com/2079-9292/7/11/272

Internet

https://www.mdpi.com/2079-9292/7/11/272

Similar Items