Atomic Force Microscopy Study of Discrete Dislocation Pile-ups at Grain Boundaries in Bi-Crystalline Micro-Pillars

Atomic Force Microscopy Study of Discrete Dislocation Pile-ups at Grain Boundaries in Bi-Crystalline Micro-Pillars

Compression tests at low strains were performed to theoretically analyze the effects of anisotropic elasticity, misorientation, grain boundary (GB) stiffness, interfacial dislocations, free surfaces, and critical force on dislocation pile-ups in micro-sized Face-Centered Cubic (FCC) Nickel (Ni) and...

Full description

Bibliographic Details
Main Authors: Xiaolei Chen, Thiebaud Richeton, Christian Motz, Stéphane Berbenni
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Crystals
Subjects:
micromechanical testing
micro-pillar
bi-crystal
discrete dislocation pile-up
grain boundary
free surface
Online Access:https://www.mdpi.com/2073-4352/10/5/411

Internet

https://www.mdpi.com/2073-4352/10/5/411

Similar Items