Mechanical removal of surface residues on graphene for TEM characterizations

Mechanical removal of surface residues on graphene for TEM characterizations

Abstract Contamination on two-dimensional (2D) crystal surfaces poses serious limitations on fundamental studies and applications of 2D crystals. Surface residues induce uncontrolled doping and charge carrier scattering in 2D crystals, and trapped residues in mechanically assembled 2D vertical heter...

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Bibliographic Details
Main Authors: Dong-Gyu Kim, Sol Lee, Kwanpyo Kim
Format: Article
Language:English
Published: SpringerOpen 2020-11-01
Series:Applied Microscopy
Subjects:
Atomic force microscopy
Mechanical cleaning of 2D crystals
PDMS residues
Mechanical transfer
Online Access:https://doi.org/10.1186/s42649-020-00048-1

Internet

https://doi.org/10.1186/s42649-020-00048-1

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