Mechanical removal of surface residues on graphene for TEM characterizations
Abstract Contamination on two-dimensional (2D) crystal surfaces poses serious limitations on fundamental studies and applications of 2D crystals. Surface residues induce uncontrolled doping and charge carrier scattering in 2D crystals, and trapped residues in mechanically assembled 2D vertical heter...
Main Authors: | Dong-Gyu Kim, Sol Lee, Kwanpyo Kim |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2020-11-01
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Series: | Applied Microscopy |
Subjects: | |
Online Access: | https://doi.org/10.1186/s42649-020-00048-1 |
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