THE INVESTIGATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED ETHANOL FILM BY ELLIPSOMETRIC METHOD
On the basis of analyzing the spectrum of the ellipsometric angles Δ and ψ the investigation of thickness dependences of refractive index for nanosized ethanol film on silicon and glass surface using the photometric spectral ellipsometer was carried out.
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Tver State University
2012-12-01
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| Series: | Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов |
| Subjects: | |
| Online Access: | http://physchemaspects.ru/archives/2012/%D0%A4%D0%A5-2012%20%D0%9A%D0%B8%D0%BC%20%D0%94%D0%90.pdf |