Benchmarking and Optimization of Spintronic Memory Arrays

In this article, we present a cross-layer optimization and benchmarking of various spintronic memory devices, including spin-transfer-torque magnetic random access memory (STT-MRAM), spin-orbit-torque (SOT) MRAM, voltage-controlled exchange coupling (VCEC) MRAM, and magnetoelectric (ME) MRAM. Variou...

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Bibliographic Details
Main Authors: Yu-Ching Liao, Chenyun Pan, Azad Naeemi
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9104969/