Benchmarking and Optimization of Spintronic Memory Arrays
In this article, we present a cross-layer optimization and benchmarking of various spintronic memory devices, including spin-transfer-torque magnetic random access memory (STT-MRAM), spin-orbit-torque (SOT) MRAM, voltage-controlled exchange coupling (VCEC) MRAM, and magnetoelectric (ME) MRAM. Variou...
Main Authors: | , , |
---|---|
Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
|
Series: | IEEE Journal on Exploratory Solid-State Computational Devices and Circuits |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9104969/ |