Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy

The accurate measurement of nanoscale mechanical characteristics is crucial in the emerging field of soft condensed matter for industrial applications. An atomic force microscope (AFM) can be used to conduct nanoscale evaluation of the Young’s modulus on the target surface based on site-specific for...

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Bibliographic Details
Main Authors: Seongoh Kim, Yunkyung Lee, Manhee Lee, Sangmin An, Sang-Joon Cho
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/11/6/1593