Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy
The accurate measurement of nanoscale mechanical characteristics is crucial in the emerging field of soft condensed matter for industrial applications. An atomic force microscope (AFM) can be used to conduct nanoscale evaluation of the Young’s modulus on the target surface based on site-specific for...
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doaj-3b980d0fda2a46328e7fda3d7cc8fc612021-07-01T00:26:50ZengMDPI AGNanomaterials2079-49912021-06-01111593159310.3390/nano11061593Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force MicroscopySeongoh Kim0Yunkyung Lee1Manhee Lee2Sangmin An3Sang-Joon Cho4Park Systems Corporation, 109 Gwanggyo-ro, Yeongtong-gu, Suwon 16229, Gyeonggi, KoreaPark Systems Corporation, 109 Gwanggyo-ro, Yeongtong-gu, Suwon 16229, Gyeonggi, KoreaDepartment of Physics, Chungbuk National University, Cheongju 28644, Chungbuk, KoreaDepartment of Physics, Institute of Photonics and Information Technology, Jeonbuk National University, Jeonju 54896, Jeollabuk, KoreaPark Systems Corporation, 109 Gwanggyo-ro, Yeongtong-gu, Suwon 16229, Gyeonggi, KoreaThe accurate measurement of nanoscale mechanical characteristics is crucial in the emerging field of soft condensed matter for industrial applications. An atomic force microscope (AFM) can be used to conduct nanoscale evaluation of the Young’s modulus on the target surface based on site-specific force spectroscopy. However, there is still a lack of well-organized study about the nanomechanical interpretation model dependence along with cantilever stiffness and radius of the tip apex for the Young’s modulus measurement on the soft materials. Here, we present the fast and accurate measurement of the Young’s modulus of a sample’s entire scan surface using the AFM in a newly developed PinPoint<sup>TM</sup> nanomechanical mode. This approach enables simultaneous measurements of topographical data and force–distance data at each pixel within the scan area, from which quantitative visualization of the pixel-by-pixel topographical height and Young’s modulus of the entire scan surface was realized. We examined several models of contact mechanics and showed that cantilevers with proper mechanical characteristics such as stiffness and tip radius can be used with the PinPoint<sup>TM</sup> mode to accurately evaluate the Young’s modulus depending on the sample type.https://www.mdpi.com/2079-4991/11/6/1593atomic force microscopyYoung’s moduluscantileverstiffnesstip radius |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Seongoh Kim Yunkyung Lee Manhee Lee Sangmin An Sang-Joon Cho |
spellingShingle |
Seongoh Kim Yunkyung Lee Manhee Lee Sangmin An Sang-Joon Cho Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy Nanomaterials atomic force microscopy Young’s modulus cantilever stiffness tip radius |
author_facet |
Seongoh Kim Yunkyung Lee Manhee Lee Sangmin An Sang-Joon Cho |
author_sort |
Seongoh Kim |
title |
Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy |
title_short |
Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy |
title_full |
Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy |
title_fullStr |
Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy |
title_full_unstemmed |
Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy |
title_sort |
quantitative visualization of the nanomechanical young’s modulus of soft materials by atomic force microscopy |
publisher |
MDPI AG |
series |
Nanomaterials |
issn |
2079-4991 |
publishDate |
2021-06-01 |
description |
The accurate measurement of nanoscale mechanical characteristics is crucial in the emerging field of soft condensed matter for industrial applications. An atomic force microscope (AFM) can be used to conduct nanoscale evaluation of the Young’s modulus on the target surface based on site-specific force spectroscopy. However, there is still a lack of well-organized study about the nanomechanical interpretation model dependence along with cantilever stiffness and radius of the tip apex for the Young’s modulus measurement on the soft materials. Here, we present the fast and accurate measurement of the Young’s modulus of a sample’s entire scan surface using the AFM in a newly developed PinPoint<sup>TM</sup> nanomechanical mode. This approach enables simultaneous measurements of topographical data and force–distance data at each pixel within the scan area, from which quantitative visualization of the pixel-by-pixel topographical height and Young’s modulus of the entire scan surface was realized. We examined several models of contact mechanics and showed that cantilevers with proper mechanical characteristics such as stiffness and tip radius can be used with the PinPoint<sup>TM</sup> mode to accurately evaluate the Young’s modulus depending on the sample type. |
topic |
atomic force microscopy Young’s modulus cantilever stiffness tip radius |
url |
https://www.mdpi.com/2079-4991/11/6/1593 |
work_keys_str_mv |
AT seongohkim quantitativevisualizationofthenanomechanicalyoungsmodulusofsoftmaterialsbyatomicforcemicroscopy AT yunkyunglee quantitativevisualizationofthenanomechanicalyoungsmodulusofsoftmaterialsbyatomicforcemicroscopy AT manheelee quantitativevisualizationofthenanomechanicalyoungsmodulusofsoftmaterialsbyatomicforcemicroscopy AT sangminan quantitativevisualizationofthenanomechanicalyoungsmodulusofsoftmaterialsbyatomicforcemicroscopy AT sangjooncho quantitativevisualizationofthenanomechanicalyoungsmodulusofsoftmaterialsbyatomicforcemicroscopy |
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