Microwave Annealing for NiSiGe Schottky Junction on SiGe P-Channel

In this paper, we demonstrated the shallow NiSiGe Schottky junction on the SiGe P-channel by using low-temperature microwave annealing. The NiSiGe/n-Si Schottky junction was formed for the Si-capped/SiGe multi-layer structure on an n-Si substrate (Si/Si0.57Ge0.43/Si) through microwave annealing (MW...

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Bibliographic Details
Main Authors: Yu-Hsien Lin, Yi-He Tsai, Chung-Chun Hsu, Guang-Li Luo, Yao-Jen Lee, Chao-Hsin Chien
Format: Article
Language:English
Published: MDPI AG 2015-11-01
Series:Materials
Subjects:
Online Access:http://www.mdpi.com/1996-1944/8/11/5403