Product Inspection Methodology via Deep Learning: An Overview

In this study, we present a framework for product quality inspection based on deep learning techniques. First, we categorize several deep learning models that can be applied to product inspection systems. In addition, we explain the steps for building a deep-learning-based inspection system in detai...

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Bibliographic Details
Main Authors: Tae-Hyun Kim, Hye-Rin Kim, Yeong-Jun Cho
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/15/5039