Microdiffraction imaging—a suitable tool to characterize organic electronic devices

Microdiffraction imaging—a suitable tool to characterize organic electronic devices

Tailoring device architecture and active film morphology is crucial for improving organic electronic devices. Therefore, knowledge about the local degree of crystallinity is indispensable to gain full control over device behavior and performance. In this article, we report on microdiffraction imagin...

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Bibliographic Details
Main Authors: Clemens Liewald, Simon Noever, Stefan Fischer, Janina Roemer, Tobias U. Schülli, Bert Nickel
Format: Article
Language:English
Published: AIMS Press 2015-10-01
Series:AIMS Materials Science
Subjects:
focused X-ray
polymorphism
multilayer
morphology
scanning X-ray diffraction microscopy
synchrotron
Online Access:http://www.aimspress.com/Materials/article/459/fulltext.html

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http://www.aimspress.com/Materials/article/459/fulltext.html

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