Simulation Studies of a Trench MOS Device Structure with Small Figures of Merit

We proposed a vertical high permittivity trench power MOS (HKTMOS) device with alternating N&P drift region and high permittivity (HK) trench sandwiched in between. The unique structure guarantees uniform potential distribution for wide voltage range at block state owing to both HK potential mod...

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Bibliographic Details
Main Author: Li Junhong
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201820803005