Contact Resistance Parallel Model for Edge-Contacted 2D Material Back-Gate FET

Because 2D materials have adjust band gap, high mobility ratio, bipolar, anisotropy and flexibility characters, they have become the new direction for FET’s channel materials. According to the characteristics of the layers of 2D materials, the current transport characteristics can be improved by usi...

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Bibliographic Details
Main Authors: Fei Cai, Guangsheng Deng, Xiangxiang Li, Fujiang Lin
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/9/12/2110