Comprehensive Eye Diagram Analysis: A Transfer Learning Approach

Comprehensive Eye Diagram Analysis: A Transfer Learning Approach

A deep transfer learning (TL)-based comprehensive eye diagram analysis and diagnosis scheme that can output essential eye diagram parameters, estimate fiber link length, calculate Q-factor, and diagnose device imperfection-induced impairments is proposed. TL can be used to extract system information...

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Bibliographic Details
Main Authors: Danshi Wang, Yilan Xu, Jianqiang Li, Min Zhang, Jin Li, Jun Qin, Cheng Ju, Zhiguo Zhang, Xue Chen
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Photonics Journal
Subjects:
Transfer learning
eye diagram analysis
impairment diagnosis.
Online Access:https://ieeexplore.ieee.org/document/8871178/

Internet

https://ieeexplore.ieee.org/document/8871178/

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