Modeling a Thick Hydrogenated Amorphous Silicon Substrate for Ionizing Radiation Detectors

Modeling a Thick Hydrogenated Amorphous Silicon Substrate for Ionizing Radiation Detectors

There is currently a renewed interest in hydrogenated amorphous silicon (a-Si:H) for use in particle detection applications. Whilst this material has been comprehensively investigated from a numerical perspective within the context of photovoltaic and imaging applications, the majority of work relat...

Full description

Bibliographic Details
Main Authors: Jeremy Alexander Davis, Maurizio Boscardin, Michele Crivellari, Livio Fanò, Matthew Large, Mauro Menichelli, Arianna Morozzi, Francesco Moscatelli, Maria Movileanu-Ionica, Daniele Passeri, Marco Petasecca, Mauro Piccini, Alessandro Rossi, Andrea Scorzoni, Bailey Thompson, Giovanni Verzellesi, Nicolas Wyrsch
Format: Article
Language:English
Published: Frontiers Media S.A. 2020-05-01
Series:Frontiers in Physics
Subjects:
a-Si:H
radiation hardness
large area application
radiation sensor
high energy physics
Online Access:https://www.frontiersin.org/article/10.3389/fphy.2020.00158/full

Internet

https://www.frontiersin.org/article/10.3389/fphy.2020.00158/full

Similar Items