The development and implementation of low cost radio frequency amplifier chip test solution based on PXI system

This solution is to build a set of radio frequency (RF) parallel test system with PCI extension for instrument (PXI) RF module,and realize the final test of fusion architectural and integrated RF amplifier chip.It can solve the high cost and instability of test at the same time.It also put forward s...

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Bibliographic Details
Main Author: Yang Zhen
Format: Article
Language:English
Published: Academic Journals Center of Shanghai Normal University 2017-04-01
Series:Journal of Shanghai Normal University (Natural Sciences)
Subjects:
Online Access:http://qktg.shnu.edu.cn/zrb/shsfqkszrb/ch/reader/view_abstract.aspx?file_no=20180210&flag=1