An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Main Authors: Santiago H. Andany, Gregor Hlawacek, Stefan Hummel, Charlène Brillard, Mustafa Kangül, Georg E. Fantner
• Format: Article
• Language: English
• Published: Beilstein-Institut 2020-08-01
• Series: Beilstein Journal of Nanotechnology
• Subjects: atomic force microscopy (afm); combined setup; correlative microscopy; helium ion microscopy (him); self-sensing cantilevers
• Online Access: https://doi.org/10.3762/bjnano.11.111

In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and machining of nanoscale structures with sub-nanometer resolution, while the AFM is a well-established versatile tool for multiparametric nanoscale characterization. Combining the two techniques opens the way for unprecedented in situ correlative analysis at the nanoscale. Nanomachining and analysis can be performed without contamination of the sample and environmental changes between processing steps. The practicality of the resulting tool lies in the complementarity of the two techniques. The AFM offers not only true 3D topography maps, something the HIM can only provide in an indirect way, but also allows for nanomechanical property mapping, as well as for electrical and magnetic characterization of the sample after focused ion beam materials modification with the HIM. The experimental setup is described and evaluated through a series of correlative experiments, demonstrating the feasibility of the integration.