High performance ultraviolet photodetectors with atomic-layer-deposited ZnO films via low-temperature post-annealing in air

In this work, we have investigated the effect of low temperature post-annealing in air on atomic-layer-deposited ZnO metal-semiconductor-metal (MSM) ultraviolet photodetectors (UV PDs). The results indicate that the post-annealing could reduce the dark-current of the MSM device by ten orders of magn...

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Bibliographic Details
Main Authors: Jian Gao, Wen-Jun Liu, Shi-Jin Ding, Hong-Liang Lu, David Wei Zhang
Format: Article
Language:English
Published: AIP Publishing LLC 2018-01-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5007131